Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

Author: Soudier Luc   Mermet Jean-Michel  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.49, Iss.10, 1995-10, pp. : 1478-1484

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