Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

By Soudier Luc   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 49, Iss. 10, 1995-10 ,pp. : 1478-1484

Society for Applied Spectroscopy

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Use of Normalized Relative Line Intensities for Qualitative and Semi-quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part II: Applications to Qualitative Analysis with Line-Rich Matrices

By Rivier Cedric   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 50, Iss. 8, 1996-08 ,pp. : 959-964

Society for Applied Spectroscopy

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Use of Internal Standardization to Compensate for a Wide Range of Absorbance in the Analysis of Glasses by UV Laser Ablation Inductively Coupled Plasma Atomic Emission Spectrometry

By Kanicky Viktor   Otruba Vitezslav   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 52, Iss. 5, 1998-05 ,pp. : 638-642

Society for Applied Spectroscopy

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Influence of Sample Surface Condition on Chemical Analysis Using Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy

By Mao Xianglei   Chan Wing-Tat   Russo Richard E.  

Applied Spectroscopy, Vol. 51, Iss. 7, 1997-07 ,pp. : 1047-1054

Society for Applied Spectroscopy

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Analysis of Ferrite Powder Using Inductively Coupled Plasma Atomic Emission Spectrometry

By Choi J.G.   Kim H.Y.   Lim H.B.  

Microchemical Journal, Vol. 63, Iss. 1, 1999-09 ,pp. : 119-127

Elsevier

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