Spectral Depth Profiling of Arbitrary Surfaces by Thermal Emission Decay–Fourier Transform Infrared Spectroscopy

Author: Notingher Ioan   Imhof Robert E.   Xiao Peng   Pascut Flavius C.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.57, Iss.12, 2003-12, pp. : 1494-1501

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