Characterization of V-defects in InGaN Single Quantum Well Films at the Nanometer Level by High-Spatial-Resolution Cathodoluminescence Spectroscopy

Author： Yoshikawa M. Murakami M. Ishida H. Harima H.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.62, Iss.1, 2008-01, pp. : 86-90

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