Quantitative Surface Analysis by Fourier Transform Attenuated Total Reflection Infrared Spectroscopy

By Iwamoto Reikichi   Ohta Koji  

Applied Spectroscopy, Vol. 38, Iss. 3, 1984-05 ,pp. : 359-365

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Applications of Microstructured Silicon Wafers as Internal Reflection Elements in Attenuated Total Reflection Fourier Transform Infrared Spectroscopy

By Schumacher Henrik   Künzelmann Ulrich   Vasilev Boris   Eichhorn Klaus-Jochen   Bartha Johann W.  

Applied Spectroscopy, Vol. 64, Iss. 9, 2010-09 ,pp. : 1022-1027

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Detection of Citrus Huanglongbing by Fourier Transform Infrared–Attenuated Total Reflection Spectroscopy

By Hawkins Samantha A.   Park Bosoon   Poole Gavin H.   Gottwald Timothy   Windham William R.   Lawrence Kurt C.  

Applied Spectroscopy, Vol. 64, Iss. 1, 2010-01 ,pp. : 100-103

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Optical Depth Profiling by Attenuated Total Reflection Fourier Transform Infrared Spectroscopy: A New Approach

By Ekgasit Sanong   Ishida Hatsuo  

Applied Spectroscopy, Vol. 50, Iss. 9, 1996-09 ,pp. : 1187-1195

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Attenuated Total Reflection Fourier Transform Infrared Spectroscopy Analysis of Human Hair Fiber Structure

By Lyman Donald J.   Schofield Paula  

Applied Spectroscopy, Vol. 62, Iss. 5, 2008-05 ,pp. : 525-535

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