Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS)

Author： Hahn Matthias   Behrens Harald   Tegge-Schüring Astrid   Koepke Jürgen   Horn Ingo   Rickers Karen   Falkenberg Gerald   Wiedenbeck Michael  

Publisher： E. Schweizerbart'sche Verlagsbuchhandlung

ISSN： 0935-1221

Source： European Journal of Mineralogy, Vol.17, Iss.2, 2005-04, pp. : 233-242

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