Quantitative analysis of fluid inclusions by synchrotron X-ray fluorescence: calibration of Cu and Zn in synthetic quartz inclusions

By Nagaseki Hiroki   Hayashi Ken-Ichiro   Iida Atsuo  

European Journal of Mineralogy, Vol. 18, Iss. 3, 2006-05 ,pp. : 309-318

E. Schweizerbart'sche Verlagsbuchhandlung

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Trace-element analysis of individual synthetic and natural fluid inclusions with synchrotron radiation XRF using Monte Carlo simulations for quantification

By Rickers Karen   Thomas Rainer   Heinrich Wilhelm  

European Journal of Mineralogy, Vol. 16, Iss. 1, 2004-01 ,pp. : 23-35

E. Schweizerbart'sche Verlagsbuchhandlung

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Quantitative trace element analysis of single fluid inclusions by proton-induced X-ray emission (PIXE): application to fluid inclusions in hydrothermal quartz

By Kurosawa M.   Shimano S.   Ishii S.   Shima K.   Kato T.  

Geochimica et Cosmochimica Acta, Vol. 67, Iss. 22, 2003-11 ,pp. : 4337-4352

Elsevier

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Trace element diffusion and element partitioning between garnet and andesite melt using synchrotron X-ray fluorescence microanalysis (µ-SRXRF)

By Koepke Jürgen   Falkenberg Gerald   Rickers Karen   Diedrich Otto  

European Journal of Mineralogy, Vol. 15, Iss. 5, 2003-10 ,pp. : 883-892

E. Schweizerbart'sche Verlagsbuchhandlung

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Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS)

By Hahn Matthias   Behrens Harald   Tegge-Schüring Astrid   Koepke Jürgen   Horn Ingo   Rickers Karen   Falkenberg Gerald   Wiedenbeck Michael  

European Journal of Mineralogy, Vol. 17, Iss. 2, 2005-04 ,pp. : 233-242

E. Schweizerbart'sche Verlagsbuchhandlung

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