Defect depth estimation using pulsed eddy current with varied pulse width excitation

Author: Abidin I Zainal   Mandache C   Tian G Y   Li Yong  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.51, Iss.2, 2009-02, pp. : 69-72

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