PEC: Computation of coil-induced voltage due to a defect-free plate using Stehfest's method for pulsed eddy current evaluation

Author: Fan Mengbao   Cao Binghua   Wang Yuqiao  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.52, Iss.6, 2010-06, pp. : 302-304

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract

The pulsed eddy current technique has demonstrated considerable promise as a new tool for the evaluation of conducting plate structures. Recently, much attention has been paid to the Laplace transform-based method for the calculation of transient probe response. However, use of the Laplace transform-based method usually results in solutions in the complex domain that are not exactly invertible. In this paper, Stehfest's algorithm is proposed to numerically convert the coil-induced voltage from the Laplace domain into the time domain. To evaluate the Stehfest's method, prediction of induced voltage for a driver-pick-up probe above an aluminum plate energised by a step current has been compared with analytical results. The comparison shows excellent agreement between numerical and analytical methods, which confirms the applicability of Stehfest's algorithm for the computation of coil-induced voltage.

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