High-precision measurements in few-electron highly charged ions at the HeidelbergElectron Beam Ion Trap (EBIT)

Author: López-Urrutia JR C.   Braun J   Brenner G   Bruhns H   Draganič I N   Martínez AJ González   Lapierre A   Mironov V   Osborne C   Sikler G   Orts R Soria   Tawara H   Ullrich J   Tupitsyn I I   Shabaev V M  

Publisher: NRC Research Press

ISSN: 1208-6045

Source: Canadian Journal of Physics, Vol.83, Iss.4, 2005-04, pp. : 387-393

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Abstract