Erratum: Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in anelectron beam ion trap

By Beiersdorfer P   Fournier K B   Chen M H   Träbert E  

Canadian Journal of Physics, Vol. 84, Iss. 8, 2006-08 ,pp. : 773-773

NRC Research Press

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High-precision measurements in few-electron highly charged ions at the HeidelbergElectron Beam Ion Trap (EBIT)

By López-Urrutia JR C.   Braun J   Brenner G   Bruhns H   Draganič I N   Martínez AJ González   Lapierre A   Mironov V   Osborne C   Sikler G   Orts R Soria   Tawara H   Ullrich J   Tupitsyn I I   Shabaev V M  

Canadian Journal of Physics, Vol. 83, Iss. 4, 2005-04 ,pp. : 387-393

NRC Research Press

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The study of X-ray M-shell spectra of W ions from the Lawrence Livermore National Laboratory Electron Beam Ion Trap

By Neill P   Harris C   Safronova A S   Hamasha S   Hansen S   Safronova U I   Beiersdorfer P  

Canadian Journal of Physics, Vol. 82, Iss. 11, 2004-11 ,pp. : 931-942

NRC Research Press

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Structure and dynamics of highly charged heavy ions studied with the electron beam ion trap in Tokyo

By Nakamura Nobuyuki  

Hyperfine Interactions, Vol. 199, Iss. 1-3, 2011-07 ,pp. : 123-130

Springer Publishing Company

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EUV spectral lines of highly-charged Hf, Ta and Au ions observed with an electron beam ion trap

By Draganić Ilija N   Ralchenko Yuri   Reader Joseph   Gillaspy J D   Tan Joseph N   Pomeroy Joshua M   Brewer Samuel M   Osin Dmitry  

Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 44, Iss. 2, 2011-01 ,pp. : 25001-25012

IOP Publishing

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