Erratum: Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in anelectron beam ion trap

Author: Beiersdorfer P   Fournier K B   Chen M H   Träbert E  

Publisher: NRC Research Press

ISSN: 1208-6045

Source: Canadian Journal of Physics, Vol.84, Iss.8, 2006-08, pp. : 773-773

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