Electrical conduction in layer silicates investigated by combined scanning tunnelling microscopy and atomic force microscopy

Author: Lindgreen H.  

Publisher: Mineralogical Society

ISSN: 1471-8030

Source: Clay Minerals, Vol.35, Iss.4, 2000-09, pp. : 643-652

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract