JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC)

Publisher： John Wiley & Sons Inc

Founded in： 1968

Total resources： 19

E-ISSN： 1600-5767

ISSN： 0021-8898

Subject： O7 Crystallography

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC)

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Organizing a crystallization laboratory

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 47-54

John Wiley & Sons Inc

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Determination of porosity in anisotropic fractal systems by neutron scattering

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 175-184

John Wiley & Sons Inc

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Reconstructing three‐dimensional protein crystal intensities from sparse unoriented two‐axis X‐ray diffraction patterns. Corrigendum

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 230-230

John Wiley & Sons Inc

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Evidence of anatase intergrowths formed during slow cooling of reduced ilmenite

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 185-192

John Wiley & Sons Inc

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Hindered nematic alignment of hematite spindles in poly(N‐isopropylacrylamide) hydrogels: a small‐angle X‐ray scattering and rheology study

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 87-96

John Wiley & Sons Inc

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CarbX: a program for the evaluation of wide‐angle X‐ray scattering data of non‐graphitic carbons

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 219-229

John Wiley & Sons Inc

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Texture of nanocrystalline solids: atomic scale characterization and applications

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 124-132

John Wiley & Sons Inc

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Metals and Alloys: Industrial Applications. By Mark Antony Benvenuto. DeGruyter, 2016. Pp. 153. Price EUR 69.95, USD 98.00, GBP 52.99. ISBN 978‐3‐11‐040784‐6.

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 231-232

John Wiley & Sons Inc

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Aluminium diboride‐type structure in Ethiopian opal‐CT revealed by fast Fourier transform

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 27-34

John Wiley & Sons Inc

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Correct interpretation of diffraction properties of quartz crystals for X‐ray optics applications

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC) , Vol. 51, Iss. 1, 2018-02 , pp. 140-147

John Wiley & Sons Inc

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