

Author: Chaplanov A.M. Shcherbakova E.N.
Publisher: MAIK Nauka/Interperiodica
ISSN: 0020-1685
Source: Inorganic Materials, Vol.37, Iss.3, 2001-03, pp. : 233-236
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


Electrochemical study of hydrogen diffusion in a vanadium thin film
By Di Vece M. Remhof A. Kelly J.J.
Electrochemistry Communications, Vol. 6, Iss. 1, 2004-01 ,pp. :








Lithium diffusion in cerium-vanadium mixed oxide thin films: a systematic study
By Varsano F. Decker F. Masetti E. Croce F.
Electrochimica Acta, Vol. 46, Iss. 13, 2001-04 ,pp. :