An X-Ray Photoelectron Spectroscopy Study of the Acidity of SiO 2 -ZrO 2 Mixed Oxides

By Bosman H.J.M.   Pijpers A.P.   Jaspers A.W.M.A.  

Journal of Catalysis, Vol. 161, Iss. 2, 1996-02 ,pp. : 551-559

Academic Press

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Porosity and Surface Acidity of SiO₂–Al₂O₃ Xerogels

By Bandosz T.J.   Lin C.   Ritter J.A.  

Journal of Colloid and Interface Science, Vol. 198, Iss. 2, 1998-02 ,pp. : 347-353

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Molecular Composition and Orientation of Interstitial versus Surface Silicon Oxides for Si(111)/SiO₂ and Si(100)/SiO₂ Interfaces using FT-IR and X-ray Photoelectron Spectroscopies

By Kandilioti Georgia   Siokou Angeliki   Papaefthimiou Vasiliki   Kennou Stella   Gregoriou Vasilis G.  

Applied Spectroscopy, Vol. 57, Iss. 6, 2003-06 ,pp. : 628-635

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Instrumentation for X- and gamma-ray spectrometry: Thermoluminescent response of commercial SiO₂ optical fiber to gamma-radiation

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Journal of Radioanalytical and Nuclear Chemistry, Vol. 264, Iss. 1, 2005-04 ,pp. : 107-111

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A study of the SiO₂-aqueous electrolyte (NaCl, CsCl) interface by X-ray photoelectron spectroscopy

By Shchukarev A.  

Colloid Journal, Vol. 69, Iss. 4, 2007-08 ,pp. : 514-525

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