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Industrial Laboratory, Vol. 66, Iss. 10, 2000-10 ,pp. : 657-662

Springer Publishing Company

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A Contactless Device for Determining the Lifetime of Minor Charge Carriers in Silicon Wafers with p–n-Junctions

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Industrial Laboratory, Vol. 66, Iss. 10, 2000-10 ,pp. : 669-670

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An Unusual Dependence of the Charge Carrier Mobility in Disordered Organic Materials on Trap Concentration: Real Phenomenon or Artifact?

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Journal of Imaging Science and Technology, Vol. 43, Iss. 5, 1999-09 ,pp. : 444-449

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A method for determining the thermal EMF and thermal conductivity

By Edgorova D.   Dzhakhanov S.   Karimov A.   Kuliev Sh.  

Instruments and Experimental Techniques, Vol. 49, Iss. 3, 2006-05 ,pp. : 435-437

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Measurement of the Electrical Conductivity and the Hall Coefficient of Anisotropic Semiconductor Single Crystals and Films

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Industrial Laboratory, Vol. 66, Iss. 9, 2000-09 ,pp. : 593-597

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