Experimental determination of stability of field-effect transistors under pulsed overloads

Author: Bobreshov A.   Dyboi A.   Kitaev Yu.   Nesterenko Yu.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.50, Iss.5, 2007-09, pp. : 679-683

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Abstract