Simulating the exposure of ICs to voltage surges caused by nuclear explosions

Author： Epifantsev K.   Gerasimchuk O.   Skorobogatov P.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7397

Source： Russian Microelectronics, Vol.38, Iss.4, 2009-07, pp. : 260-272

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