Author: Trager-Cowan C. Sweeney F. Winkelmann A. Wilkinson A. J. Trimby P. W. Day A. P. Gholinia A. Schmidt N. H. Parbrook P. J. Watson I. M.
Publisher: Maney Publishing
ISSN: 1743-2847
Source: Materials Science and Technology, Vol.22, Iss.11, 2006-11, pp. : 1352-1358
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Janssens K. G. F. Van der Biest O. Vanheliemont J. Maes H. E. Hull R. Bean J. C.
Materials Science and Technology, Vol. 11, Iss. 1, 1995-01 ,pp. :
Advances in electron backscatter diffraction
Materials Science and Technology, Vol. 22, Iss. 11, 2006-11 ,pp. :
Electron backscatter diffraction and cracking
Materials Science and Technology, Vol. 18, Iss. 2, 2002-02 ,pp. :