Structural characterisation of anodic SiO2 thin films on n-type Si

Author: Woon W. S.   Hutagalung S. D.   Cheong K. Y.  

Publisher: Maney Publishing

ISSN: 1743-2944

Source: Surface Engineering, Vol.24, Iss.5, 2008-09, pp. : 388-391

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract