Metrological implications of recent interferometric wavelength measurements for singly ionized silicon in the vacuum ultraviolet (152 nm and 180 nm)

By Reader J.  

Metrologia, Vol. 39, Iss. 4, 2002-12 ,pp. : 391-394

IOP Publishing

Access to resources Recommend Favorite

Frequency comparison of He-Ne/iodine lasers at lambda = 633 nm between the NILPRP and the ISI, and traceability through the BIPM

By Petru F.   Lazar J.   Cip O.   Popescu G.   Chartier J.-M.  

Metrologia, Vol. 34, Iss. 6, 1997-12 ,pp. : 515-518

IOP Publishing

Access to resources Recommend Favorite

Comparison between the He-Ne laser wavelength standards at 633 nm from the UME and the BIPM

By Erin M.   Malinovsky I.   Titov A.   Chartier A.   Chartier J.-M.  

Metrologia, Vol. 32, Iss. 5, 1995-10 ,pp. : 363-365

IOP Publishing

Access to resources Recommend Favorite

Absolute measurement of the hyperfine splittings of six molecular ¹²⁷I₂ lines around the He-Ne/I₂ wavelength at λ ≈ 633 nm

By Simonsen H. R.   Rose F.  

Metrologia, Vol. 37, Iss. 6, 2000-12 ,pp. : 651-658

IOP Publishing

Access to resources Recommend Favorite

Comparison between absolute thermal radiometers at wavelengths of 1300 nm and 1550 nm

By Corredera P.   Hernanz M. L.   Campos J.   Corróns A.   Pons A.   Fontecha J. L.  

Metrologia, Vol. 37, Iss. 5, 2000-11 ,pp. : 543-546

IOP Publishing

Access to resources Recommend Favorite