Wavelength measurements of three iodine lines between 780 nm and 795 nm

By Bodermann B.   Bonsch G.   Knockel H.   Nicolaus A.   Tiemann E.  

Metrologia, Vol. 35, Iss. 2, 1998-05 ,pp. : 105-113

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Absolute silicon photodiodes for 160 nm to 254 nm photons

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Metrologia, Vol. 35, Iss. 4, 1998-08 ,pp. : 329-334

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Detector calibration in the wavelength region 10 nm to 100 nm based on a windowless rare gas ionization chamber

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Validation of a new facility at the Metrology Light Source for the calibration of radiation sources in the wavelength range from 116 nm to 400 nm

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Metrologia, Vol. 51, Iss. 5, 2014-10 ,pp. : 528-538

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Absolute power measurements at wavelengths of 1300 nm and 1550 nm with a cryogenic radiometer and a tuneable laser diode

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Metrologia, Vol. 37, Iss. 5, 2000-11 ,pp. : 519-522

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