Trace elements in quartz – a combined electron microprobe, secondary ion mass spectrometry, laser-ablation ICP-MS, and cathodoluminescence study

By Müller Axel   Wiedenbeck Michael   van den Kerkhof Alfons M.   Kronz Andreas   Simon Klaus  

European Journal of Mineralogy, Vol. 15, Iss. 4, 2003-08 ,pp. : 747-763

E. Schweizerbart'sche Verlagsbuchhandlung

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The low-boron contest: minimising surface contamination and analysing boron concentrations at the ng/g-level by secondary ion mass spectrometry

By Marschall H. R.   Ludwig T.  

Mineralogy and Petrology, Vol. 81, Iss. 3-4, 2004-06 ,pp. : 265-278

Springer Publishing Company

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Detrital, metamorphic and metasomatic tourmaline in high-pressure metasediments from Syros (Greece): intra-grain boron isotope patterns determined by secondary-ion mass spectrometry

By Marschall Horst   Altherr Rainer   Kalt Angelika   Ludwig Thomas  

Contributions to Mineralogy and Petrology, Vol. 155, Iss. 6, 2008-06 ,pp. : 703-717

Springer Publishing Company

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Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS)

By Hahn Matthias   Behrens Harald   Tegge-Schüring Astrid   Koepke Jürgen   Horn Ingo   Rickers Karen   Falkenberg Gerald   Wiedenbeck Michael  

European Journal of Mineralogy, Vol. 17, Iss. 2, 2005-04 ,pp. : 233-242

E. Schweizerbart'sche Verlagsbuchhandlung

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Quantitative multi-element analysis of minerals, fluid and melt inclusions by laser-ablation inductively-coupled-plasma mass-spectrometry

By Heinrich C.A.   Pettke T.   Halter W.E.   Aigner-Torres M.   Audetat A.   Gunther D.   Hattendorf B.   Bleiner D.   Guillong M.   Horn I.  

Geochimica et Cosmochimica Acta, Vol. 67, Iss. 18, 2003-09 ,pp. : 3473-3497

Elsevier

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