Energy distribution extraction of negative charges responsible for positive bias temperature instability

By Shang-Qing Ren   Hong Yang   Wen-Wu Wang   Bo Tang   Zhao-Yun Tang   Xiao-Lei Wang   Hao Xu   Wei-Chun Luo   Chao Zhao   Jiang Yan   Da-Peng Chen   Tian-Chun Ye  

Chinese Physics B, Vol. 24, Iss. 7, 2015-07 ,pp. : 77304-77308

IOP Publishing

Access to resources Recommend Favorite

Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier

By Oh Seungha                 Kim Sungmin      

Journal of Physics D: Applied Physics, Vol. 47, Iss. 16, 2014-04 ,pp. : 165103-165108

IOP Publishing

Access to resources Recommend Favorite

Flat-roof phenomenon of dynamic equilibrium phase in the negative bias temperature instability effect on a power MOSFET

By Yue Zhang   Qing-Qing Zhuo   Hong-Xia Liu   Xiao-Hua Ma   Yue Hao  

Chinese Physics B, Vol. 23, Iss. 5, 2014-05 ,pp. : 57304-57307

IOP Publishing

Access to resources Recommend Favorite

Impact of charge trapping effect on negative bias temperature instability in P-MOSFETs with HfO2/SiON gate stack

By  

Journal of Physics: Conference Series , Vol. 100, Iss. 4, 2008-03 ,pp. : 186-189

IOP Publishing

Access to resources Recommend Favorite

Germanium PMOSFETs with Low-Temperature Si₂H₆ Passivation Featuring High Hole Mobility and Superior Negative Bias Temperature Instability

By Hong-Juan Wang   Gen-Quan Han   Yan Liu   Jing Yan   Chun-Fu Zhang   Jin-Cheng Zhang   Yue Hao  

Chinese Physics Letters, Vol. 31, Iss. 5, 2014-05 ,pp. : 58503-58506

IOP Publishing

Access to resources Recommend Favorite