Flat-roof phenomenon of dynamic equilibrium phase in the negative bias temperature instability effect on a power MOSFET

Author: Yue Zhang   Qing-Qing Zhuo   Hong-Xia Liu   Xiao-Hua Ma   Yue Hao  

Publisher: IOP Publishing

ISSN: 1674-1056

Source: Chinese Physics B, Vol.23, Iss.5, 2014-05, pp. : 57304-57307

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