Multi-frequency electron spin resonance analysis of interfacial Ge dangling bond defects in condensation-grown (1 0 0)Si/SiO2/Si1–xGex/SiO2

Author: Stesmans A   Somers P   Afanas’ev V V  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.28, Iss.1, 2013-01, pp. : 15003-15006

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