Direct observation of thermal energy transfer across the thin metal film on silicon substrates by a rear heating–front detection thermoreflectance technique

Author： Firoz S H   Yagi T   Taketoshi N   Ishikawa K   Baba T  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.22, Iss.2, 2011-02, pp. : 24012-24017

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