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Period of time: 2016年2期
Publisher: IOP Publishing
Founded in: 1920
Total resources: 43
ISSN: 0957-0233
Subject: O4 Physics
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Measurement Science and Technology,volume 22,issue 2
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By Tanaka Mitsuru,Baba Tetsuya,Postek Michael T in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
Scanning probe microscope dimensional metrology at NIST
By Kramar John A,Dixson Ronald,Orji Ndubuisi G in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
Nanometrology using a through-focus scanning optical microscopy method
By Attota Ravikiran,Silver Richard in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
Characterizing a scatterfield optical platform for semiconductor metrology
By Barnes B M,Attota R,Quintanilha R,Sohn Y-J,Silver R M in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
Review of current progress in nanometrology with the helium ion microscope
By Postek Michael T,Vladár András,Archie Charles,Ming Bin in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
Development of the metrology and imaging of cellulose nanocrystals
By Postek Michael T,Vladár András,Dagata John,Farkas Natalia,Ming Bin,Wagner Ryan,Raman Arvind,Moon Robert J,Sabo Ronald,Wegner Theodore H,Beecher James in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
By Farkas N,Dagata J A,Yang C,Rait A,Pirollo K F,Chang E H in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
By Imamura M,Matsubayashi N,Fan J,Kojima I,Sasaki M in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.![](/images/ico/ico5.png)
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By Ehara Kensei,Sakurai Hiromu in (2011)
Measurement Science and Technology,volume 22,issue 2 , Vol. 22, Iss. 2, 2011-02 , pp.