Dielectric spectroscopy of a thin surface layer by differential time-domain reflectometry using a coplanar waveguide circuit line probe

Author： Shirakashi R Ogawa T Yamada J

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.24, Iss.2, 2013-02, pp. : 25501-25510

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