Thermally induced morphology evolution of pit-patterned Si substrate and its effect on nucleation properties of Ge dots

Author: Chen Hung-Ming   Kuan Chieh-Hsiung   Suen Yuen-Wuu   Luo Guang-Li   Lai Yen-Pu   Wang Fu-Min   Chen Shih-Ta  

Publisher: IOP Publishing

ISSN: 0957-4484

Source: Nanotechnology, Vol.23, Iss.1, 2012-01, pp. : 15303-15308

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content