Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers

Author： Slattery Ashley D Blanch Adam J Quinton Jamie S Gibson Christopher T

Publisher： IOP Publishing

ISSN： 0957-4484

Source： Nanotechnology, Vol.24, Iss.1, 2013-01, pp. : 15710-15722

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