Structure analysis of thin iron-silicide film from &phis;-scan RHEED Patterson function

Author： Romanyuk Oleksandr   Kataoka Keita   Matsui Fumihiko   Hattori Ken   Daimon Hiroshi  

Publisher： Springer Publishing Company

ISSN： 0011-4626

Source： Czechoslovak Journal of Physics, Vol.56, Iss.3, 2006-03, pp. : 267-276

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