Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis

By Dulot F.   Kierren B.   Malterre D.  

Thin Solid Films, Vol. 423, Iss. 1, 2003-01 ,pp. : 64-69

Elsevier

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Reflection high-energy electron loss spectroscopy (RHEELS): a new approach in the investigation of epitaxial thin film growth by reflection high-energy electron diffraction (RHEED)

By Masek K.   Moroz V.   Matoln V.  

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Structure analysis of thin iron-silicide film from &phis;-scan RHEED Patterson function

By Romanyuk Oleksandr   Kataoka Keita   Matsui Fumihiko   Hattori Ken   Daimon Hiroshi  

Czechoslovak Journal of Physics, Vol. 56, Iss. 3, 2006-03 ,pp. : 267-276

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Epitaxial metal silicides: Interface mapping by scanning probe techniques

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Subpixel detection in video RHEED image analysis

By Peuchot B.   Matolin V.  

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