Nanomachining Zr-based metallic glass surfaces using an atomic force microscope

By Kawasegi Noritaka   Morita Noboru   Yamada Shigeru   Takano Noboru   Oyama Tatsuo   Ashida Kiwamu   Ofune Hitoshi  

International Journal of Machining and Machinability of Materials, Vol. 2, Iss. 1, 2007-03 ,pp. : 3-16

Inderscience Publishers

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Force nanolithography on various surfaces by atomic force microscope

By Hassani S. Sadegh   Sobat Z.   Aghabozorg H.R.  

International Journal of Nanomanufacturing, Vol. 5, Iss. 3-4, 2010-07 ,pp. : 217-224

Inderscience Publishers

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Atomic force microscope-based nanomanipulation with drift compensation

By Yang Qinmin   Jagannathan S.  

International Journal of Nanotechnology, Vol. 3, Iss. 4, 2006-10 ,pp. : 527-544

Inderscience Publishers

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Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers

By Slattery Ashley D   Blanch Adam J   Quinton Jamie S   Gibson Christopher T  

Nanotechnology, Vol. 24, Iss. 1, 2013-01 ,pp. : 15710-15722

IOP Publishing

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A Signal Preamplifier of the Piezoelectric Vibration Transducer of the Cantilever of an Atomic-Force Microscope

By Kazantsev D.  

Instruments and Experimental Techniques, Vol. 48, Iss. 6, 2005-11 ,pp. : 807-812

MAIK Nauka/Interperiodica

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