A New Low Temperature Device for High Resolution, In Situ Measurement and Control of Submicron Gaps

Author: More T.   Dax C.   Niemela J.   Ihas G.  

Publisher: Springer Publishing Company

ISSN: 0022-2291

Source: Journal of Low Temperature Physics, Vol.121, Iss.5-6, 2000-12, pp. : 825-830

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract