Mapping of residual stresses around an indentation in β-Si3N4 using Raman spectroscopy

Author: Muraki N.   Katagiri G.   Sergo V.   Pezzotti G.   Nishida T.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.32, Iss.20, 1997-12, pp. : 5419-5423

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Abstract