High-resolution transmission electron microscopy investigation of a stacking fault in β-Si3N4

Author： Ning X.G.   Wilkinson D.S.   Weatherly G.C.   Ye H.Q.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.32, Iss.6, 1997-06, pp. : 1431-1436

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