An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite

Author: CHEN Y. J.   WILSON I. H.   XU J. B.   LIBIN LIN  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.33, Iss.18, 1998-09, pp. : 4657-4663

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