Preparation and characterization of ZrF4-BaF2-EuF3 planar glass films by electron cyclotron resonance plasma-enhanced chemical vapor deposition

Author: Kawamoto* Y.   Kanno R.   Konishi A.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.33, Iss.23, 1998-12, pp. : 5607-5611

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Abstract