Characterization of yttria-stabilized zirconia thin films deposited by electron beam evaporation on silicon substrates

Author: Hartmanova M.   Thurzo I.   Jergel M.   Bartos J.   Kadlec F.   Zelezny V.   Tunega D.   Kundracik F.   Chromik S.   Brunel M.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.33, Iss.4, 1998-02, pp. : 969-975

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