Structural characterization of BDN-SOH LB films using small angle XRD and Fourier transform IR spectroscopy

Author： Yang D.   Lä W.   Sun Y.   Xiong Y.   Wang R.   Li G.   Guo Y.   Da D.   Li H.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.34, Iss.22, 1999-11, pp. : 5569-5574

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