Effects of temperature on the resistivity of vacuum deposited Cu-MgF2 cermet thin films: an investigation of conduction mechanism

Author： Katumba G.   Olumekor L.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.34, Iss.24, 1999-12, pp. : 6041-6044

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