Microstructural characterisation of alumina with Ti ion implantation

Author: Ji H.   Evans P.J.   Samandi M.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.35, Iss.14, 2000-07, pp. : 3681-3684

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content