Accuracy of energy dispersive x-ray composition analysis of YBCO films on yttrium-containing substrates as compared to Rutherford backscattering spectroscopy

Author： Mustapha Z.   Chan S-W.   Lam A.   Gerhardt R.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.35, Iss.2, 2000-01, pp. : 443-448

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