Author: Choi J.S. Oh T.S. Choo W.K.
Publisher: Springer Publishing Company
ISSN: 0022-2461
Source: Journal of Materials Science, Vol.35, Iss.3, 2000-02, pp. : 655-660
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Effect of SiO2 Thickness on GaAs Nanowires on Si (111) Substrates Grown by Molecular Beam Epitaxy
Advanced Materials Research, Vol. 2015, Iss. 1131, 2016-01 ,pp. :