Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process

Author: Lenormand P.   Lecomte A.   Laberty-Robert C.   Ansart F.   Boulle A.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.42, Iss.12, 2007-06, pp. : 4581-4590

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