Fabrication and characterization of Ge nanocrystalline growth by ion implantation in SiO2 matrix

Author: Mestanza S.   Doi I.   Swart J.   Frateschi N.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.42, Iss.18, 2007-09, pp. : 7757-7761

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