Quantum confinement effect in SiO_2 films containing Ge microcrystallites

Author： Tang N.Y.   Wu X.M.   Zhuge L.J.   Ye C.N.   Yao W.G.   Chen J.   Dong Y.M.   Yu Y.H.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.37, Iss.11, 2002-06, pp. : 2259-2261

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