Retrieval of the Characteristics and Determination of the Parameters of Statistical Nanometer Surface Roughness using the Data on Scattering in a Planar Optical Waveguide in the Presence of Additive Noise

By Egorov A.A.  

Radiophysics and Quantum Electronics, Vol. 45, Iss. 7, 2002-07 ,pp. : 527-533

Springer Publishing Company

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Scattering from an abruptly terminated planar metamaterial waveguide

By Manenkov A.   Gerolymatos P.   Tigelis I.  

Radiophysics and Quantum Electronics, Vol. 53, Iss. 3, 2010-08 ,pp. : 191-200

Springer Publishing Company

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An Integral approach to measurement of surface roughness parameters from light scattering in dielectric waveguides

By Osovitskii A.  

Journal of Communications Technology and Electronics, Vol. 56, Iss. 1, 2011-01 ,pp. : 35-38

MAIK Nauka/Interperiodica

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Theory of waveguide light scattering in an integrated optical waveguide in the presence of noise

By Egorov A.  

Radiophysics and Quantum Electronics, Vol. 48, Iss. 1, 2005-01 ,pp. : 57-67

Springer Publishing Company

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Characterization of Yarn Mass Parameters and Production Characteristics Using Optical Sensors, Capacitive Sensors and Image Processing

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International Journal of Sensors Wireless Communications and Control, Vol. 2, Iss. 3, 2012-12 ,pp. : 145-156

Bentham Science Publishers

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